UID:
almahu_9948197506702882
Umfang:
1 online resource (xiv, 601 pages) :
,
illustrations
Ausgabe:
Electronic reproduction. [Place of publication not identified] : HathiTrust Digital Library, 2010.
ISBN:
9780470317471
,
0470317477
,
9780470316795
,
0470316799
Inhalt:
Useful methodology has been developed in accelerated testing. This work deals with the topic Accelerated Testing: Statistical Models, Test Plans, and Data Analyses. It is useful for practitioners.
Anmerkung:
Accelerated Testing Statistical Models, Test Plans, and Data Analyses; Contents; Preface; 1. Introduction and Background; 2. Models for Life Tests with Constant Stress; 3. Graphical Data Analysis; 4. Complete Data and Least Squares Analyses; 5. Censored Data and Maximum Ukelihood Methods; 6. Test Plans; 7. Competing Failure Modes and Size Effect; 8. Least-Squares Comparisons for Complete Data; 9. Maximum Likelihood Comparisons for Censored and Other Data; 10. Models and Data Analyses for Step and Varying Stress; 11. Accelerated Degradation; Appendix A. Statistical Tables; References; Index.
,
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
,
English.
Weitere Ausg.:
Print version: Nelson, Wayne, 1936- Accelerated testing. New York : Wiley, ©1990 ISBN 9780471522775
Sprache:
Englisch
Schlagwort(e):
Electronic books.
DOI:
10.1002/9780470316795
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/9780470316795
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