Format:
IX, 313 S
,
Ill., graph. Darst
ISBN:
0735400032
Series Statement:
AIP conference proceedings 567
Note:
Includes bibliographical references and indexes
Language:
English
Keywords:
Bayes-Inferenz
;
Maximum-Entropie-Methode
;
Konferenzschrift
URL:
http://aip.scitation.org/toc/apc/567/1
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