Format:
1 Online-Ressource (530 pages)
ISBN:
076950146X
,
9780769501468
Content:
The theme of the April 1999 symposium "Scaling deeper to submicron: test technology challenges" reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored and analyzed in the 62 paper presentations. The paper sessions span key areas in testing, such as BIST, mixed signal test, Iddq test, diagnosis, validation /verification, boundary scan, memory test, delay test and ATPG. Other sessions on emerging areas include defect level test, testing high speed circuits, MEMS test, and high-level test techniques. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR
Language:
English
Keywords:
Konferenzschrift
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