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AUTOTESTCON 2005 : Orlando, FL, 26-29 September 2005 (2005)

Autotestcon (2005 :Orlando, Fla.) ; Institute of Electrical and Electronics Engineers

Piscataway, N.J : IEEE Operations Center

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UID:

gbv_894477625

Format: 1 Online-Ressource (xxvii, 867 pages) , illustrations

ISBN: 0780391012 , 9780780391017

Note: "IEEE Catalog Number: 05CH37671 , "Our conference theme, Technology Powering the Next Generation of Test, is reflected in our excellent technical program documented in these proceedings"--Added title page , Includes bibliographical references and author index

Language: English

Keywords: Konferenzschrift

URL: Volltext

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