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Goodness-of-fit tests and model validity : [an International Conference on Goodness-of-Fit Tests and Model Validity was organized at Paris, France, during May 29 - 31, 2000] (2002)

Huber-Carol, Catherine 1943- ; International Conference on Goodness of Fit Tests and Model Validity 2000 Paris

Boston, Mass. [u.a.] : Birkhäuser

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UID:

gbv_347117171

Format: XXXIII, 507 S. , graph. Darst.

ISBN: 0817642099 , 3764342099

Series Statement: Statistics for industry and technology

Note: Literaturangaben

Language: English

Subjects: Mathematics

RVK:

SD 2000

Keywords: Güte der Anpassung ; Statistischer Test ; Konferenzschrift

URL: Verlagsangaben

URL: Inhaltsverzeichnis

URL: Inhaltstext

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Goodness-of-fit tests and model validity (2002)

Huber-Carol, Catherine

Boston [u.a.] : Birkhäuser

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UID:

kobvindex_ZLB13362170

Format: XXXIII, 503 Seiten , graph. Darst. , 26 cm

ISBN: 3764342099 , 0817642099

Series Statement: Statistics for industry and technology

Note: Literaturangaben

Language: English

Keywords: Statistischer Test ; Kongress ; Paris 〈2000〉 ; Statistisches Modell ; Validität ; Kongress ; Paris 〈2000〉 ; Kongress ; Konferenzschrift

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Berlin VÖBB/ZLB

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