Format:
1 Online-Ressource (xii, 1012 pages)
,
illustrations
ISBN:
0818631678
,
081863166X
,
0780307607
,
9780818631672
,
9780818631665
,
9780780307605
Note:
"IEEE Computer Society Press order number 3167"--Page ii
,
"IEEE catalog number 92-CH3191-4"--Page ii
,
Cover title
,
Includes bibliographical references and index
Additional Edition:
Print version International Test Conference (1992 : Baltimore, Md.) Discover the new world of test and design Altoona, PA : The Conference ; Piscataway, NJ : Can be ordered from IEEE Service Center, ©1992
Language:
English
Keywords:
Konferenzschrift
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