UID:
almahu_9948697872802882
Umfang:
1 online resource (500 pages) :
,
illustrations
ISSN:
2375-1053
Inhalt:
Reports on recent concepts, methodologies, and trends in testing electronic circuits and systems to meet the challenges of a wider range of capabilities being integrated into compact products, and the higher quality being demanded. Some 90 papers explore such aspects as designing for testability, on-line testing, volume manufacturing, sequential circuits, multi-chip modules and memory testing, non-traditional approaches, fault simulation and test generation, and built-in self-tests. No subject index. Annotation copyright by Book News, Inc., Portland, OR.
Anmerkung:
Bibliographic Level Mode of Issuance: Monograph
,
English
In:
VLSI Test Symposium, 2375-1053
Weitere Ausg.:
ISBN 9780818673047
Weitere Ausg.:
ISBN 0818673044
Sprache:
Englisch
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