Format:
VI, 315 S.
,
graph. Darst.
ISBN:
0863411657
Series Statement:
Institution of Electrical Engineers: IEEE computing series 15.
Note:
Literaturangaben
Language:
English
Subjects:
Computer Science
Keywords:
VLSI
;
Entwurf
;
VLSI
;
Prüftechnik
;
Wafer-Integration
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