X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
Type of Medium
Language
Region
Library
Years
Person/Organisation
Keywords
  • 1
    Online Resource
    Online Resource
    High Cycle Fatigue of Al and Cu Thin Films by a Novel High-Throughput Method (2013)
    KIT Scientific Publishing
    Details
    UID:
    edoccha_9959145697902883
    Format: 1 electronic resource (XII, 140 p. p.)
    ISBN: 1000034759
    Series Statement: Schriftenreihe des Instituts für Angewandte Materialien, Karlsruher Institut für Technologie
    Content: In the last two decades, the reliability of small electronic devices used in automotive or consumer electronics gained researchers attention. Thus, there is the need to understand the fatigue properties and damage mechanisms of thin films. In this thesis a novel high-throughput testing method for thin films on Si substrate is presented. The specialty of this method is to test one sample at different strain amplitudes at the same time and measure an entire lifetime curve with only one experiment.
    Note: English
    Additional Edition: ISBN 3-7315-0025-6
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Online Resource
    Charité
  • 2
    Online Resource
    Online Resource
    High Cycle Fatigue of Al and Cu Thin Films by a Novel High-Throughput Method (2013)
    KIT Scientific Publishing
    Details
    UID:
    edocfu_9959145697902883
    Format: 1 electronic resource (XII, 140 p. p.)
    ISBN: 1000034759
    Series Statement: Schriftenreihe des Instituts für Angewandte Materialien, Karlsruher Institut für Technologie
    Content: In the last two decades, the reliability of small electronic devices used in automotive or consumer electronics gained researchers attention. Thus, there is the need to understand the fatigue properties and damage mechanisms of thin films. In this thesis a novel high-throughput testing method for thin films on Si substrate is presented. The specialty of this method is to test one sample at different strain amplitudes at the same time and measure an entire lifetime curve with only one experiment.
    Note: English
    Additional Edition: ISBN 3-7315-0025-6
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Online Resource
    FU Berlin
  • 3
    Online Resource
    Online Resource
    High Cycle Fatigue of Al and Cu Thin Films by a Novel High-Throughput Method (2013)
    KIT Scientific Publishing
    Details
    UID:
    almahu_9949711011102882
    Format: 1 electronic resource (XII, 140 p. p.)
    ISBN: 1000034759
    Series Statement: Schriftenreihe des Instituts für Angewandte Materialien, Karlsruher Institut für Technologie
    Content: In the last two decades, the reliability of small electronic devices used in automotive or consumer electronics gained researchers attention. Thus, there is the need to understand the fatigue properties and damage mechanisms of thin films. In this thesis a novel high-throughput testing method for thin films on Si substrate is presented. The specialty of this method is to test one sample at different strain amplitudes at the same time and measure an entire lifetime curve with only one experiment.
    Note: English
    Additional Edition: ISBN 3-7315-0025-6
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Online Resource
    HU Berlin
  • 4
    Online Resource
    Online Resource
    Respect for persons : a philosophical analysis of the moral, political and religious idea of the supreme worth of the individual person (2021)
    London, England ; : Routledge, Taylor & Francis Group,
    Details
    UID:
    almahu_9949767661702882
    Format: 1 online resource (297 pages)
    ISBN: 9781000034752 (e-book)
    Additional Edition: Print version: Downie, Robert. Respect for persons : a philosophical analysis of the moral, political and religious idea of the supreme worth of the individual person. London, England ; New York, NY ; Routledge, Taylor & Francis Group, 2021, c1969 ISBN 9780367899042
    Language: English
    Keywords: Electronic books.
    URL: Click to View
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Online Resource
    HU Berlin
Nothing or not found what you are looking for? Please check your search query or use the Interlibrary Loan Search.
Did you mean 1000034459?
Did you mean 1000033759?
Did you mean 1000034259?
Close ⊗
This website uses cookies and the analysis tool Matomo. Further information can be found on the KOBV privacy pages