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International Test Conference 2017 : proceedings : October 31-November 2, 2017, Fort Worth Convention Center, Fort Worth, Texas USA (2017)

International Test Conference 48. 2017 Fort Worth, Tex. ; Institute of Electrical and Electronics Engineers ; Institute of Electrical and Electronics Engineers Philadelphia Section

[Piscataway, NJ] : IEEE

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UID:

gbv_1011834294

Format: 1 Online-Ressource , Illustrationen

ISBN: 9781538634134

Note: Literaturangaben , "It is our privilege to welcome you to the 48th International Test Conference (ITC) sponsored by IEEE and the IEEE Philadelphia Section." - Welcome message

Additional Edition: ISBN 9781538634141

Language: English

Keywords: Konferenzschrift

URL: Volltext

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