Format:
XV, 388 S.
,
graph. Darst.
Edition:
1. ed.
ISBN:
1402032072
Series Statement:
Frontiers in electronic testing 29
Language:
English
Subjects:
Engineering
Keywords:
System-on-Chip
;
Integrierte Schaltung
;
Fehlererkennung
;
Testen
URL:
http://www.loc.gov/catdir/enhancements/fy0663/2006274784-d.html
URL:
http://www.loc.gov/catdir/enhancements/fy0814/2006274784-b.html
URL:
http://www.loc.gov/catdir/enhancements/fy0814/2006274784-t.html
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