KOBV Portal

Hits per page

hit 1 - 1 | 1 hit

Sorting

Article

Fugger, M. ; Plappert, M. ; Schaefer, C. ; [et al.]

Show associated volumes

add to watchlist on the watchlist

Details

UID:

gbv_816262306

Format: Ill., graph. Darst.

ISSN: 0026-2714

In: Microelectronics reliability, Amsterdam [u.a.] : Elsevier, 1964, 54(2014), 11, Seite 2487-2493, 0026-2714

In: volume:54

In: year:2014

In: number:11

In: pages:2487-2493

Language: English

Author information: Nowottnick, Mathias 1964-

Bookmarklink

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Article

hit 1 - 1 | 1 hit

Nothing or not found what you are looking for? Please check your search query or use the Interlibrary Loan Search.

Did you mean 812623096?

Did you mean 814202306?

Did you mean 815232306?

Kooperativer Bibliotheksverbund