UID:
almahu_9949945398002882
Format:
1 online resource (x, 258 pages) :
,
illustrations
ISBN:
9780081010891
,
0081010893
Note:
Laser diode reliability / Mitsuo Fukuda and Giovanna Mura Multi-component model for semiconductor laser degradation / Samuel K.K. Lam and Daniel T. Cassidy Reliability of laser diodes for high-rate optical communications - a Monte Carlo-based method to predict lifetime distributions and failure rates in operating conditions / Laurent Mendizabal, Frédéric Verdier, Yannick Deshayes, Yves Ousten, Yves Danto and Laurent Béchou Laser diode characteristics / Massimo Vanzi Laser diode DC measurement protocols / Massimo Vanzi Laser diode DC measurement protocols / Massimo Vanzi, Giovanna Mura, Laurent Béchou, Giulia Marcello and Valerio Sanna Valle/
Additional Edition:
ISBN 9781785481543
Additional Edition:
ISBN 1785481541
Language:
English
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