Format:
Online-Ressource
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Ill., graph. Darst.
Edition:
Online-Ausg. 2006 Springer eBook Collection. Chemistry and Materials Science Electronic reproduction; Available via World Wide Web
ISBN:
9780387372310
Series Statement:
NanoScience and technology
Content:
Werner Hofer
Content:
Useful for researchers, teachers, and graduate students, this work offers information about the field of scanning probe theory. It explains the theory behind simulation techniques, and gives examples of theoretical concepts through simulations, including the means to compare these results with experimental data
Note:
Includes bibliographical references and index
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Preface; CONTENTS; Mathematical Symbols; 1 The Physics of Scanning Probe Microscopes; 2 SPM: The Instrument; 3 Theory of Forces; 4 Electron Transport Theory; 5 Transport in the Low Conductance Regime; 6 Bringing Theory to Experiment in SFM; 7 Topographic images; 8 Single-Molecule Chemistry; 9 Current and Force Spectroscopy; 10 Outlook; Appendix; Index
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CoverContents -- Preface -- Mathematical Symbols -- 1 The Physics of Scanning Probe Microscopes -- 1.1 Experimental methods -- 1.2 Theoretical methods -- 1.3 Local probes -- 1.3.1 Principles of local probes -- 1.3.2 Surface preparation -- 1.4 Summary -- References -- 2 SPM: The Instrument -- 2.1 SPM Setups -- 2.1.1 STM setup -- 2.1.2 SFM setup -- 2.1.3 Tip and surface preparation -- 2.2 Experimental development -- 2.2.1 STM Case 1: Au(110) and Au(111) -- 2.2.2 STM Case 2: Resolution of Spin States -- 2.2.3 SFM Case 1: silicon (111) 7 x 7 -- 2.2.4 SFM case 2: cubic crystals -- References -- 3 Theory of Forces -- 3.1 Macroscopic forces -- 3.1.1 Van der Waals force -- 3.1.2 Image forces -- 3.1.3 Capacitance force -- 3.1.4 Forces due to tip and surface charging -- 3.1.5 Magnetic forces -- 3.1.6 Capillary forces -- 3.2 Microscopic forces -- 3.2.1 Theoretical methods for calculating the microscopic forces -- 3.3 Forces due to electron transitions -- 3.4 Summary -- References -- 4 Electron Transport Theory -- 4.1 Conductance channels -- 4.2 Elastic transport -- 4.2.1 The scattering matrix -- 4.2.2 Transmission functions -- 4.2.3 A brief introduction to Green's functions -- 4.2.4 Green's functions and scattering matrices -- 4.2.5 Scattering matrices for multiple channels -- 4.2.6 Self-energies S -- 4.3 Nonequilibrium conditions -- 4.3.1 Finite-bias voltage -- 4.3.2 Spectral functions and charge density -- 4.3.3 Spectral functions and contacts -- 4.3.4 Self-energy S again -- 4.3.5 Nonequilibrium Green's functions -- 4.3.6 Electron transport in nonequilibrium systems -- 4.4 Transport within standard DFT methods -- 4.4.1 Green's function matrix -- 4.4.2 General self-consistency cycle -- 4.4.3 Self-energy of the leads -- 4.4.4 Hartree potential and Hamiltonian of the interface -- 4.4.5 Self-energies of the interface -- 4.4.6 Nonequilibrium Green's functions of the interface -- 4.4.7 Calculation of nonequilibrium transport properties -- 4.5 Summary -- References -- 5 Transport in the Low Conductance Regime -- 5.1 Tersoff-Hamann(TH) approach -- 5.1.1 Easy modeling: applying the Tersoff-Hamann model -- 5.2 Perturbation approach -- 5.2.1 Explicit derivation of the tunneling current -- 5.2.2 Tip states of spherical symmetry -- 5.2.3 Magnetic tunneling junctions -- 5.3 Landauer-Bèuttiker approach -- 5.3.1 Scattering and perturbation method -- 5.4 Keldysh-Green's function approach -- 5.5 Unified model for scattering and perturbation -- 5.5.1 Scattering and perturbation -- 5.5.2 Green's function of the vacuum barrier -- tidtid.
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Literaturangaben
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Electronic reproduction; Available via World Wide Web
Additional Edition:
ISBN 9780387400907
Additional Edition:
Erscheint auch als Druck-Ausgabe Foster, Adam Scanning probe microscopy New York, NY : Springer, 2006 ISBN 9780387400907
Additional Edition:
ISBN 9781441923066
Additional Edition:
ISBN 0387400907
Language:
English
Subjects:
Physics
Keywords:
Rastersondenmikroskopie
DOI:
10.1007/0-387-37231-8
URL:
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