UID:
almafu_9959328342002883
Format:
1 online resource
Edition:
2nd ed.
ISBN:
9780470727133
,
0470727136
,
9780470027844
,
0470027843
,
9780470727126
,
0470727128
Series Statement:
Quantitative software engineering series
Content:
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this p.
Note:
Microstructural Characterization of Materials; Contents; Preface to the Second Edition; Preface to the First Edition; 1 The Concept of Microstructure; 2 Diffraction Analysis of Crystal Structure; 3 Optical Microscopy; 4 Transmission Electron Microscopy; 5 Scanning Electron Microscopy; 6 Microanalysis in Electron Microscopy; 7 Scanning Probe Microscopy and Related Techniques; 8 Chemical Analysis of Surface Composition; 9 Quantitative and Tomographic Analysis of Microstructure; Appendices; Index.
Additional Edition:
Print version: Brandon, D.G. Microstructural characterization of materials. Chichester, England : John Wiley, 2008 ISBN 9780470027844
Additional Edition:
ISBN 0470027843
Language:
English
Keywords:
Electronic books.
;
Electronic books.
;
Electronic books.
DOI:
10.1002/9780470727133
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/9780470727133
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/9780470727133
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/9780470727133
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