UID:
almafu_9959327715202883
Format:
1 online resource (xiv, 426 pages) :
,
illustrations
ISBN:
9780470502648
,
0470502649
,
9780470502624
,
0470502622
Note:
TWO-DIMENSIONAL X-RAY DIFFRACTION; CONTENTS; Preface; 1. Introduction; 2. Geometry Conventions; 3. X-Ray Source and Optics; 4. X-Ray Detectors; 5. Goniometer and Sample Stages; 6. Data Treatment; 7. Phase Identification; 8. Texture Analysis; 9. Stress Measurement; 10. Small-Angle X-Ray Scattering; 11. Combinatorial Screening; 12. Quantitative Analysis; 13. Innovation and Future Development; Appendix A. Values of Commonly Used Parameters; Appendix B. Symbols; Index.
Additional Edition:
Print version: He, Bob B., 1954- Two-dimensional x-ray diffraction. Hoboken, N.J. : Wiley, ©2009 ISBN 9780470227220
Language:
English
Keywords:
Electronic books.
;
Electronic books.
DOI:
10.1002/9780470502648
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/9780470502648
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/9780470502648
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