UID:
almafu_9959327441802883
Format:
1 online resource (xxiv, 384 pages) :
,
illustrations
ISBN:
9780470747254
,
0470747250
,
9780470747261
,
0470747269
,
0470511370
,
9780470511374
,
1282237136
,
9781282237131
Content:
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit method.
Note:
Failure analysis and ESD -- Failure analysis tools, models, and physics of failure -- CMOS failure mechanisms -- CMOS circuits : receivers and off-chip drivers -- CMOS integration -- SOI ESD failure mechanisms -- RF CMOS and ESD -- Micro-electromechanical systems -- Gallium arsenide -- Smart power, LDMOS and BCD technology -- Magnetic recording -- Photo-masks and reticles : failure mechanisms.
Additional Edition:
Print version: Voldman, Steven H. ESD. Chichester, West Sussex, U.K. ; Hoboken, N.J. : J. Wiley, 2009 ISBN 9780470511374
Additional Edition:
ISBN 0470511370
Language:
English
Keywords:
Electronic books.
;
Electronic books.
;
Electronic books.
;
Electronic books.
;
Electronic books.
;
Electronic books.
DOI:
10.1002/9780470747254
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/9780470747254
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/9780470747254
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/9780470747254
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