Kooperativer Bibliotheksverbund

UID:

Umfang: 1 online resource (xi, 206 pages) : , illustrations

ISBN: 9780470228319 , 0470228318 , 9780470228302 , 047022830X , 1281204013 , 9781281204011

Inhalt: The book covers RF power amplifier design, from device and modeling considerations to advanced circuit design architectures and techniques. It focuses on recent developments and advanced topics in this area, including numerous practical designs to back the theoretical considerations. It presents the challenges in designing power amplifiers in silicon and helps the reader improve the efficiency of linear power amplifiers, and design more accurate compact device models, with faster extraction routines, to create cost effective and reliable circuits.

Anmerkung: Introduction -- , Semiconductor Technology and RF Power Amplifier Design -- , Device Modeling -- , Power Amplifier IC Design -- , Power Amplifier Linearity -- , Modulation Schemes -- , Circuit Simulation -- , Load-Pull Measurements -- , Device Modeling for CAD -- , Bipolar Junction and Heterojunction Bipolar Transistors -- , Bipolar Device Models -- , The Ebers-Moll Model -- , The Gummel-Poon Model -- , The VBIC Model -- , MEXTRAM -- , HICUM -- , MOSFET Device Physics -- , MOSFET Device Models -- , The Level 1 Model -- , The Level 2 and Level 3 Models -- , BSIM -- , The BSIM2 and HSPICE Level 28 Models -- , BSIM3 -- , MOS Model 9 and MOS Model 11 -- , BSIM4 -- , Empirical Modeling of Bipolar Devices -- , Modeling the HBT versus the BJT -- , Parameter Extraction -- , Motivation for an Empirical Bipolar Device Model -- , Physics-Based and Empirical Models -- , Compatibility between Large- and Small-Signal Models -- , Model Construction and Parameter Extraction -- , Current Source Model -- , Current Source Model Parameter Extraction -- , Extraction of Intrinsic Capacitances -- , Extraction of Base Resistance -- , Parameter Extraction Procedure -- , Temperature-Dependent InGaP/GaAs HBT Large-Signal Model -- , Empirical Si BJT Large-Signal Model -- , Extension of the Empirical Modeling Method to the SiGe HBT-- , Scalable Modeling of RF MOSFETS -- , Introduction -- , NQS Effects -- , Distributed Gate Resistance -- , Distributed Substrate Resistance -- , Scalable Modified BSIM3v3 Model -- , Scalability of MOSFET Model -- , Extraction of Small-Signal Model Parameters -- , Scalable Substrate Network Modeling -- , Modified BSIM3v3 Model -- , Power Amplifier IC Design -- , Power Amplifier Design Methodology -- , Classes of Operation -- , Performance Metrics -- , Thermal Instability and Ballasting -- , Power Amplifier Design in Silicon -- , A 2.4-GHz High-Efficiency SiGe HBT Power Amplifier -- , Circuit Design Considerations -- , Analysis of Ballasting for SiGe HBT Power Amplifiers -- , Harmonic Suppression Filter and Output Match Network -- , Performance of the Power Amplifier Module -- , RF Power Amplifier Design Using Device Periphery Adjustment-- , Analysis of the Device Periphery Adjustment Technique-- , 1.9-GHz CMOS Power Amplifier -- , 1.9-GHz CDMA/PCS SiGe HBT Power Amplifier -- , Nonlinear Term Cancellation for Linearity Improvement.

Weitere Ausg.: Print version: Raghavan, Arvind. Modeling and design techniques for RF power amplifiers. Hoboken, N.J. : Wiley-Interscience : IEEE Press, ©2008

Sprache: Englisch

Schlagwort(e): Electronic books. ; Electronic books. ; Electronic books. ; Electronic books. ; Electronic books. ; Electronic books. ; Electronic books. ; Electronic books. ; Electronic books.

DOI: 10.1002/9780470228319

URL: https://onlinelibrary.wiley.com/doi/book/10.1002/9780470228319

URL: https://onlinelibrary.wiley.com/doi/book/10.1002/9780470228319

URL: https://onlinelibrary.wiley.com/doi/book/10.1002/9780470228319

UID:

Umfang: XI, 206 S. , Ill., graph. Darst.

ISBN: 9780471717461

Anmerkung: Includes bibliographical references and index

Sprache: Englisch

Fachgebiete: Technik

Schlagwort(e): Hochfrequenzverstärker ; Schaltungsentwurf

URL: Publisher description

URL: Contributor biographical information

UID:

Umfang: xi, 206 p. : , ill.

Ausgabe: Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

Sprache: Englisch

Schlagwort(e): Electronic books.

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