Format:
Online-Ressource (1 online resource (388 p.))
,
digital, PDF file(s).
Edition:
Online-Ausg.
ISBN:
9780511541124
Series Statement:
The Cambridge RF and Microwave Engineering Series
Content:
This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices
Content:
RF and microwave power transistors -- Compact modeling of high-power FETs -- Electrical measurement techniques -- Passive components -- Thermal characterization and modeling -- Modeling the active transistor -- Function approximation for compact modeling -- Model implementation in CAD tools -- Model validation
Note:
Title from publisher's bibliographic system (viewed on 05 Oct 2015)
Additional Edition:
ISBN 9780521870665
Additional Edition:
ISBN 9780521336178
Additional Edition:
Erscheint auch als Druck-Ausgabe Aaen, Peter H. Modeling and characterization of RF and microwave power FETs Cambridge [u.a.] : Cambridge University Press, 2007 ISBN 0521870666
Additional Edition:
ISBN 9780521870665
Additional Edition:
Erscheint auch als Druck-Ausgabe ISBN 9780521870665
Language:
English
Subjects:
Engineering
Keywords:
Feldeffekttransistor
;
Hochfrequenztechnik
DOI:
10.1017/CBO9780511541124
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