Umfang:
Online-Ressource (1 online resource (408 p.))
,
digital, PDF file(s).
Ausgabe:
Online-Ausg.
ISBN:
9780511600302
Inhalt:
The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology
Inhalt:
Interactions of ions with matter / Nobutsugu Imanishi -- Gas assisted ion beam etching and disposition / Hyoung Ho (Chris) Kang, Clive Chandler, and Matthew Weschler -- Imaging using electrons and ion beams / Kaoru Ohya and Tohru Ishitani -- Characterization methods using FIB/SEM DualBeam instrumentation / Steven Reyntjens and Lucille A. Giannuzzi -- High-density FIB SEM 3D nanotomography : with applications of real-time imaging during FIB milling / E.L. Principe -- Fabrication of nanoscale structures using ion beams / Ampere A. Tseng -- Preparation for physico-chemical analysis / Richard Langford -- In-situ sample manipulation and imaging / T. Kamino [and others] -- Micro-machining and mask repair / Mark Utlaut -- Three-dimensional visualization of nanostructured materials using focused ion beam tomography / Derren Dunn, Alan J. Kubis, and Robert Hull -- Ion beam implantation of surface layers / Daniel Recht and Nan Yao -- Applications for biological materials / Kirk Hou and Nan Yao -- Focused ion beam systems as a multifunctional tool for nanotechnology / Toshiaki Fujii, Tatsuya Asahata, and Takashi Kaito
Anmerkung:
Title from publisher's bibliographic system (viewed on 05 Oct 2015)
Weitere Ausg.:
ISBN 9780521831994
Weitere Ausg.:
ISBN 9780521158596
Weitere Ausg.:
Erscheint auch als Druck-Ausgabe Focused ion beam systems Cambridge [u.a.] : Cambridge University Press, 2007 ISBN 0521831997
Weitere Ausg.:
ISBN 9780521831994
Weitere Ausg.:
Erscheint auch als Druck-Ausgabe ISBN 9780521831994
Sprache:
Englisch
Schlagwort(e):
Ionenstrahl
;
Oberflächenanalyse
DOI:
10.1017/CBO9780511600302
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