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  • 1
    Online Resource
    Online Resource
    Electron microprobe analysis and scanning electron microscopy in geology / (2005)
    Cambridge :Cambridge University Press,
    Details
    UID:
    almahu_9948233853702882
    Format: 1 online resource (xiii, 189 pages) : , digital, PDF file(s).
    Edition: Second edition.
    ISBN: 9780511610561 (ebook)
    Content: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
    Note: Title from publisher's bibliographic system (viewed on 05 Oct 2015).
    Additional Edition: Print version: ISBN 9780521848756
    Language: English
    Subjects: Earth Sciences , Geography
    RVK:
    RB 10118
    RVK:
    TG 1100
    URL: https://doi.org/10.1017/CBO9780511610561
    URL: Volltext  (URL des Erstveröffentlichers)
    Library Location Call Number Volume/Issue/Year Availability
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    Online Resource
    Online Access
    HU Berlin
    TU Berlin
  • 2
    Book
    Book
    Electron microprobe analysis and scanning electron microscopy in geology (2005)
    Cambridge [u.a.] : Cambridge Univ. Press
    Details
    UID:
    gbv_493473335
    Format: XIII, 189 S. , Ill., graph. Darst.
    Edition: 2. ed.
    ISBN: 052184875X , 9780521848756
    Note: Includes bibliographical references and index , Hier auch später erschienene, unveränderte Nachdrucke
    Additional Edition: Erscheint auch als Online-Ausgabe Reed, Stephen J. Electron microprobe analysis and scanning electron microscopy in geology Cambridge : Cambridge University Press, 2005 ISBN 9780511610561
    Language: English
    Subjects: Chemistry/Pharmacy , Earth Sciences , Geography
    RVK:
    RB 10118
    RVK:
    TG 1100
    RVK:
    VG 9900
    Keywords: Geowissenschaften ; Rasterelektronenmikroskopie ; Geowissenschaften ; Elektronenstrahlmikroanalyse ; Geologie ; Mikrosonde ; Probenvorbereitung ; Geologie ; Mikrospektralanalyse ; Rasterelektronenmikroskop
    URL: Inhaltsverzeichnis
    URL: http://www.loc.gov/catdir/enhancements/fy0668/2006462720-t.html
    Library Location Call Number Volume/Issue/Year Availability
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    Book
    UB Potsdam get availability status
  • 3
    Online Resource
    Online Resource
    Electron microprobe analysis and scanning electron microscopy in geology (2005)
    Cambridge : Cambridge University Press
    Details
    UID:
    gbv_883394413
    Format: 1 Online-Ressource (xiii, 189 Seiten, 8 ungezählte Seiten) , Illustrationen
    Edition: Second edition
    ISBN: 9780511610561
    Content: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories
    Additional Edition: ISBN 9780521848756
    Additional Edition: ISBN 10 052184875X
    Additional Edition: ISBN 9780521142304
    Additional Edition: Erscheint auch als Druck-Ausgabe Reed, Stephen J. Electron microprobe analysis and scanning electron microscopy in geology Cambridge [u.a.] : Cambridge Univ. Press, 2005 ISBN 052184875X
    Additional Edition: ISBN 9780521848756
    Language: English
    Subjects: Chemistry/Pharmacy , Earth Sciences , Geography
    RVK:
    RB 10118
    RVK:
    VG 9900
    RVK:
    TG 1100
    Keywords: Geowissenschaften ; Rasterelektronenmikroskopie ; Geowissenschaften ; Elektronenstrahlmikroanalyse ; Geologie ; Mikrosonde ; Probenvorbereitung ; Geologie ; Mikrospektralanalyse ; Rasterelektronenmikroskop
    DOI: 10.1017/CBO9780511610561
    URL: Volltext
    Library Location Call Number Volume/Issue/Year Availability
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    Online Resource
    Online Access
    Open Access Request
    UB Potsdam
  • 4
    Online Resource
    Online Resource
    Electron microprobe analysis and scanning electron microscopy in geology / (2005)
    Cambridge ; : Cambridge University Press,
    Details
    UID:
    edocfu_9960117172202883
    Format: 1 online resource (xiii, 189 pages) : , digital, PDF file(s).
    Edition: 2nd ed.
    ISBN: 1-107-15309-3 , 1-280-43496-1 , 9786610434961 , 0-511-18235-X , 0-511-19980-5 , 0-511-30034-4 , 0-511-61056-4 , 0-511-12542-9
    Content: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
    Note: Title from publisher's bibliographic system (viewed on 05 Oct 2015). , Cover; Half-title; Title; Copyright; Contents; Preface; Acknowledgments; 1 Introduction; 2 Electron–specimen interactions; 3 Instrumentation; 4 Scanning electron microscopy; 5 X-ray spectrometers; 6 Element mapping; 7 X-ray analysis (1); 8 X-ray analysis (2); 9 Sample preparation; Appendix; References; Index; , English
    Additional Edition: ISBN 0-521-14230-X
    Additional Edition: ISBN 0-521-84875-X
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Online Resource
    FU Berlin
  • 5
    Online Resource
    Online Resource
    Electron microprobe analysis and scanning electron microscopy in geology / (2005)
    Cambridge ; : Cambridge University Press,
    Details
    UID:
    almafu_9960117172202883
    Format: 1 online resource (xiii, 189 pages) : , digital, PDF file(s).
    Edition: 2nd ed.
    ISBN: 1-107-15309-3 , 1-280-43496-1 , 9786610434961 , 0-511-18235-X , 0-511-19980-5 , 0-511-30034-4 , 0-511-61056-4 , 0-511-12542-9
    Content: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
    Note: Title from publisher's bibliographic system (viewed on 05 Oct 2015). , Cover; Half-title; Title; Copyright; Contents; Preface; Acknowledgments; 1 Introduction; 2 Electron–specimen interactions; 3 Instrumentation; 4 Scanning electron microscopy; 5 X-ray spectrometers; 6 Element mapping; 7 X-ray analysis (1); 8 X-ray analysis (2); 9 Sample preparation; Appendix; References; Index; , English
    Additional Edition: ISBN 0-521-14230-X
    Additional Edition: ISBN 0-521-84875-X
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Online Resource
    FU Berlin
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