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  • 1
    Online-Ressource
    Online-Ressource
    Cambridge :Cambridge University Press,
    UID:
    almahu_9948233853702882
    Umfang: 1 online resource (xiii, 189 pages) : , digital, PDF file(s).
    Ausgabe: Second edition.
    ISBN: 9780511610561 (ebook)
    Inhalt: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
    Anmerkung: Title from publisher's bibliographic system (viewed on 05 Oct 2015).
    Weitere Ausg.: Print version: ISBN 9780521848756
    Sprache: Englisch
    Fachgebiete: Geowissenschaften , Geographie
    RVK:
    RVK:
    URL: Volltext  (URL des Erstveröffentlichers)
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 2
    Buch
    Buch
    Cambridge [u.a.] :Cambridge Univ. Press,
    UID:
    almafu_BV020868693
    Umfang: XIII, 189 S. : , Ill., graph. Darst.
    Ausgabe: 2. ed.
    ISBN: 978-0-521-84875-6 , 0-521-84875-x
    Sprache: Englisch
    Fachgebiete: Geographie
    RVK:
    Schlagwort(e): Elektronenstrahlmikroanalyse ; Geologie ; Rasterelektronenmikroskopie ; Geologie ; Geowissenschaften ; Rasterelektronenmikroskopie
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 3
    Online-Ressource
    Online-Ressource
    Cambridge : Cambridge University Press
    UID:
    gbv_883394413
    Umfang: 1 Online-Ressource (xiii, 189 Seiten, 8 ungezählte Seiten) , Illustrationen
    Ausgabe: Second edition
    ISBN: 9780511610561
    Inhalt: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories
    Weitere Ausg.: ISBN 9780521848756
    Weitere Ausg.: ISBN 10 052184875X
    Weitere Ausg.: ISBN 9780521142304
    Weitere Ausg.: Erscheint auch als Druck-Ausgabe Reed, Stephen J. Electron microprobe analysis and scanning electron microscopy in geology Cambridge [u.a.] : Cambridge Univ. Press, 2005 ISBN 052184875X
    Weitere Ausg.: ISBN 9780521848756
    Sprache: Englisch
    Fachgebiete: Chemie/Pharmazie , Geowissenschaften , Geographie
    RVK:
    RVK:
    RVK:
    Schlagwort(e): Geowissenschaften ; Rasterelektronenmikroskopie ; Geowissenschaften ; Elektronenstrahlmikroanalyse ; Geologie ; Mikrosonde ; Probenvorbereitung ; Geologie ; Mikrospektralanalyse ; Rasterelektronenmikroskop
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 4
    Buch
    Buch
    Cambridge : Cambridge University Press
    UID:
    kobvindex_GFZ95302
    Umfang: xiii, 192 S. : zahlr. graph. Darst.
    Ausgabe: 2nd ed.
    ISBN: 052184875X , 978-0-521-84875-6
    Anmerkung: MAB0014.001: M 05.0438 , MAB0014.002: M 07.0130
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 5
    Online-Ressource
    Online-Ressource
    Cambridge ; : Cambridge University Press,
    UID:
    almafu_9960117172202883
    Umfang: 1 online resource (xiii, 189 pages) : , digital, PDF file(s).
    Ausgabe: 2nd ed.
    ISBN: 1-107-15309-3 , 1-280-43496-1 , 9786610434961 , 0-511-18235-X , 0-511-19980-5 , 0-511-30034-4 , 0-511-61056-4 , 0-511-12542-9
    Inhalt: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
    Anmerkung: Title from publisher's bibliographic system (viewed on 05 Oct 2015). , Cover; Half-title; Title; Copyright; Contents; Preface; Acknowledgments; 1 Introduction; 2 Electron–specimen interactions; 3 Instrumentation; 4 Scanning electron microscopy; 5 X-ray spectrometers; 6 Element mapping; 7 X-ray analysis (1); 8 X-ray analysis (2); 9 Sample preparation; Appendix; References; Index; , English
    Weitere Ausg.: ISBN 0-521-14230-X
    Weitere Ausg.: ISBN 0-521-84875-X
    Sprache: Englisch
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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