Kooperativer Bibliotheksverbund

UID:

Umfang: 1 online resource (various pagings) : , illustrations (some color).

ISBN: 0-7503-1383-8

Serie: [IOP release 6]

Inhalt: This book presents a comprehensive overview of the various characterisation techniques involved in solid state research. The generalised approach offers a deeper understanding of the benefits, drawbacks and overlap within different characterisation techniques. In particular, the book examines techniques within diffraction, microscopy and spectroscopy and discusses thermal, electric and magnetic characterisation.

Anmerkung: "Version: 20191001"--Title page verso. , 1. Introduction -- 1.1. Overview -- 1.2. Microscopy, spectroscopy and diffraction -- 1.3. Introductory optics -- 1.4. Introduction to atomic physics -- 1.5. Introductory solid state physics , 2. Fourier series, transforms and their relevance in diffraction and microscopy -- 2.1. Introduction -- 2.2. Fourier series -- 2.3 The Fourier transform -- 2.4. Key functions and their Fourier transforms -- 2.5. The convolution theorem -- 2.6. Classic examples of diffraction patterns -- 2.7. Autocorrelation and the loss of phase information in measurements -- 2.8. Aside : some useful theorems -- 2.9. Questions , 3. Diffraction techniques -- 3.1. Elastic scattering -- 3.2. Methods -- 3.3. Diffraction : Rietveld refinement -- 3.4. Grazing incidence diffraction -- 3.5. X-ray and neutron reflectivity (XRR & NR) -- 3.6. Examples of diffraction techniques in the literature -- 3.7. Questions , 4. Microscopy techniques -- 4.1. Optical microscopy -- 4.2. Electron microscopy -- 4.3. Profilometry -- 4.4. Examples of microscopy techniques in the literature , 5. Spectroscopy techniques -- 5.1. What is spectroscopy? -- 5.2. Energy loss spectroscopy -- 5.3. Electron spectroscopy -- 5.4. Fluorescence techniques -- 5.5. Absorption spectroscopy -- 5.6. Resonance techniques -- 5.7. Examples of spectroscopy techniques in the literature , 6. Thermal characterisation -- 6.1. Some background theory -- 6.2. Calorimetry -- 6.3. Thermal conductivity -- 6.4. Examples of thermal characterisation techniques from the literature , 7. Electric characterisation -- 7.1. Introduction -- 7.2. Thermo- and magneto-electric effects -- 7.3. Basics of an electric measurement -- 7.4. Measurement of resistivity -- 7.5. Bandstructure measurements -- 7.6. Examples of electric characterisation techniques in the literature -- 7.7. Questions , 8. Magnetic characterisation -- 8.1. Fundamentals of magnetism -- 8.20 Magnetic interactions -- 8.3. Magnetometry -- 8.4. Magnetic imaging -- 8.5. Examples of magnetisation techniques in the literature -- 8.6. Questions. , Also available in print. , Mode of access: World Wide Web. , System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.

Weitere Ausg.: ISBN 0-7503-1384-6

Sprache: Englisch

Schlagwort(e): Llibres electrònics

DOI: 10.1088/2053-2563/ab2df5

URL: https://iopscience.iop.org/book/978-0-7503-1383-4

UID:

Umfang: 1 online resource (various pagings) : , illustrations (some color).

ISBN: 0-7503-1383-8

Serie: [IOP release 6]

Inhalt: This book presents a comprehensive overview of the various characterisation techniques involved in solid state research. The generalised approach offers a deeper understanding of the benefits, drawbacks and overlap within different characterisation techniques. In particular, the book examines techniques within diffraction, microscopy and spectroscopy and discusses thermal, electric and magnetic characterisation.

Anmerkung: "Version: 20191001"--Title page verso. , 1. Introduction -- 1.1. Overview -- 1.2. Microscopy, spectroscopy and diffraction -- 1.3. Introductory optics -- 1.4. Introduction to atomic physics -- 1.5. Introductory solid state physics , 2. Fourier series, transforms and their relevance in diffraction and microscopy -- 2.1. Introduction -- 2.2. Fourier series -- 2.3 The Fourier transform -- 2.4. Key functions and their Fourier transforms -- 2.5. The convolution theorem -- 2.6. Classic examples of diffraction patterns -- 2.7. Autocorrelation and the loss of phase information in measurements -- 2.8. Aside : some useful theorems -- 2.9. Questions , 3. Diffraction techniques -- 3.1. Elastic scattering -- 3.2. Methods -- 3.3. Diffraction : Rietveld refinement -- 3.4. Grazing incidence diffraction -- 3.5. X-ray and neutron reflectivity (XRR & NR) -- 3.6. Examples of diffraction techniques in the literature -- 3.7. Questions , 4. Microscopy techniques -- 4.1. Optical microscopy -- 4.2. Electron microscopy -- 4.3. Profilometry -- 4.4. Examples of microscopy techniques in the literature , 5. Spectroscopy techniques -- 5.1. What is spectroscopy? -- 5.2. Energy loss spectroscopy -- 5.3. Electron spectroscopy -- 5.4. Fluorescence techniques -- 5.5. Absorption spectroscopy -- 5.6. Resonance techniques -- 5.7. Examples of spectroscopy techniques in the literature , 6. Thermal characterisation -- 6.1. Some background theory -- 6.2. Calorimetry -- 6.3. Thermal conductivity -- 6.4. Examples of thermal characterisation techniques from the literature , 7. Electric characterisation -- 7.1. Introduction -- 7.2. Thermo- and magneto-electric effects -- 7.3. Basics of an electric measurement -- 7.4. Measurement of resistivity -- 7.5. Bandstructure measurements -- 7.6. Examples of electric characterisation techniques in the literature -- 7.7. Questions , 8. Magnetic characterisation -- 8.1. Fundamentals of magnetism -- 8.20 Magnetic interactions -- 8.3. Magnetometry -- 8.4. Magnetic imaging -- 8.5. Examples of magnetisation techniques in the literature -- 8.6. Questions. , Also available in print. , Mode of access: World Wide Web. , System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.

Weitere Ausg.: ISBN 0-7503-1384-6

Sprache: Englisch

Schlagwort(e): Llibres electrònics

DOI: 10.1088/2053-2563/ab2df5