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CMOS image sensors / (2022)

Stefanov, Konstantin D., ; Institute of Physics 〈Great Britain〉,

Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) :IOP Publishing,

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UID:

almahu_9949420920102882

Umfang: 1 online resource (various pagings) : , illustrations (some color).

ISBN: 9780750332354 , 9780750332347

Serie: [IOP release $release]

Inhalt: This book explores the operating principles of complementary metal oxide semiconductor (CMOS) image sensors, their architecture, readout circuits, and characterisation techniques.

Anmerkung: "Version: 20221201"--Title page verso. , 1. The fundamentals -- 1.1. Introduction--what is an image sensor and what does it do? -- 1.2. Charge generation -- 1.3. Charge collection -- 1.4. Charge transfer -- 1.5. Charge conversion -- 1.6. pn junction -- 1.7. MOS capacitor -- 1.8. MOS transistor -- 1.9. Source follower , 2. CMOS pixel architectures -- 2.1. History and technology -- 2.2. Photodiode APS -- 2.3. Pinned photodiode (4T) -- 2.4. Other PPD-based pixels -- 2.5. Hybrid and 3D image sensors , 3. Advanced image sensor topics -- 3.1. Photocurrent -- 3.2. Dark current -- 3.3. Reflective barrier -- 3.4. Back-side illumination -- 3.5. Depletion depth and potential gradients -- 3.6. Punch-through -- 3.7. Field-induced junctions , 4. Noise and readout techniques -- 4.1. Noise in image sensors -- 4.2. Correlated double sampling , 5. Characterisation -- 5.1. Introduction -- 5.2. Readout modes -- 5.3. Principles of EO characterisation -- 5.4. Photoresponse, non-uniformity and nonlinearity -- 5.5. Photon transfer curve -- 5.6. X-ray calibration -- 5.7. Full well capacity and dynamic range -- 5.8. Dark current and DSNU -- 5.9. Noise measurement -- 5.10. Image lag -- 5.11. Quantum efficiency -- 5.12. Electrical transfer function , 6. Electronics -- 6.1. On-chip electronics -- 6.2. Off-chip electronics. , Also available in print. , Mode of access: World Wide Web. , System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.

Weitere Ausg.: Print version: ISBN 9780750332330

Weitere Ausg.: ISBN 9780750332361

Sprache: Englisch

DOI: 10.1088/978-0-7503-3235-4

URL: https://iopscience.iop.org/book/mono/978-0-7503-3235-4

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CMOS Image Sensors. (2023)

Stefanov, Konstantin D.

Bristol :Institute of Physics Publishing,

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Details

UID:

almahu_9949927116302882

Umfang: 1 online resource (301 pages)

Ausgabe: 1st ed.

ISBN: 9780750332354

Serie: IOP Series in Sensors and Sensor Systems Series

Inhalt: The book describes the operating principles of CMOS images sensors, their architecture and performance, on-chip and external electronics, and characterisation techniques. Most of the book explores the pinned photodiode pixel, the experimental methods for image sensor characterisation, and presents many practical examples.

Anmerkung: Intro -- Preface -- Acknowledgement -- Author biography -- Konstantin D Stefanov -- List of frequently used abbreviations -- Table of common symbols and units -- Chapter 1 The fundamentals -- 1.1 Introduction-what is an image sensor and what does it do? -- 1.2 Charge generation -- 1.2.1 Photoeffect -- 1.2.2 Ionisation -- 1.3 Charge collection -- 1.3.1 Carrier lifetime -- 1.3.2 Recombination -- 1.3.3 Drift -- 1.3.4 Diffusion -- 1.4 Charge transfer -- 1.5 Charge conversion -- 1.6 pn junction -- 1.6.1 pn junction in equilibrium -- 1.6.2 pn junction under reverse bias -- 1.6.3 Charge collection -- 1.6.4 Junction capacitance -- 1.7 MOS capacitor -- 1.7.1 Depletion -- 1.7.2 Gate capacitance -- 1.8 MOS transistor -- 1.8.1 Structure -- 1.8.2 MOSFET characteristics -- 1.8.3 Output resistance and body effect -- 1.8.4 Transistor threshold -- 1.8.5 Analogue switch -- 1.8.6 MOSFET capacitor -- 1.9 Source follower -- 1.9.1 Gain -- 1.9.2 Input capacitance -- Chapter summary -- References -- Chapter 2 CMOS pixel architectures -- 2.1 History and technology -- 2.2 Photodiode APS -- 2.2.1 Structure -- 2.2.2 Operation -- 2.2.3 Performance -- 2.3 Pinned photodiode (4T) -- 2.3.1 Structure -- 2.3.2 Operation -- 2.3.3 Charge storage and full well capacity -- 2.3.4 Charge transfer -- 2.3.5 Image lag -- 2.3.6 Transistor sharing -- 2.4 Other PPD-based pixels -- 2.4.1 Global reset (5T) -- 2.4.2 In-pixel signal storage -- 2.4.3 High dynamic range -- 2.5 Hybrid and 3D image sensors -- Chapter summary -- References -- Chapter 3 Advanced image sensor topics -- 3.1 Photocurrent -- 3.2 Dark current -- 3.2.1 Sources of dark current -- 3.2.2 Depletion dark current -- 3.2.3 Diffusion dark current -- 3.2.4 Surface dark current -- 3.2.5 Dark current suppression by pinning -- 3.2.6 Temperature for dark current doubling -- 3.3 Reflective barrier -- 3.4 Back-side illumination. , 3.4.1 Front and back-side illumination -- 3.4.2 Back-side interface -- 3.4.3 BSI technologies -- 3.5 Depletion depth and potential gradients -- 3.5.1 Depletion depth as a 3D effect -- 3.5.2 Potential gradients in PPDs -- 3.6 Punch-through -- 3.7 Field-induced junctions -- Chapter summary -- References -- Chapter 4 Noise and readout techniques -- 4.1 Noise in image sensors -- 4.1.1 Thermal and reset noise -- 4.1.2 Shot noise -- 4.1.3 1/f and random telegraph noise -- 4.1.4 MOSFET noise -- 4.1.5 Source follower noise -- 4.2 Correlated double sampling -- 4.2.1 Reset noise suppression -- 4.2.2 Double sampling -- 4.2.3 Dual slope integrator -- 4.2.4 Optimal signal processing -- 4.2.5 Digital CDS and multiple sampling -- 4.2.6 Column-level noise -- 4.2.7 MOSFET optimisation -- Chapter summary -- References -- Chapter 5 Characterisation -- 5.1 Introduction -- 5.2 Readout modes -- 5.3 Principles of EO characterisation -- 5.4 Photoresponse, non-uniformity and nonlinearity -- 5.5 Photon transfer curve -- 5.5.1 Principles -- 5.5.2 Frame differencing -- 5.5.3 System gain, CVF and noise -- 5.5.4 Nonlinear PTC -- 5.5.5 PTC from dark current -- 5.5.6 Practical tips for the PTC -- 5.5.7 The PTC as a diagnostic tool -- 5.6 X-ray calibration -- 5.7 Full well capacity and dynamic range -- 5.8 Dark current and DSNU -- 5.9 Noise measurement -- 5.10 Image lag -- 5.11 Quantum efficiency -- 5.11.1 Principles -- 5.11.2 Pain-Hancock method -- 5.11.3 Modulation transfer function -- 5.12 Electrical transfer function -- Chapter summary -- References -- Chapter 6 Electronics -- 6.1 On-chip electronics -- 6.1.1 Architecture -- 6.1.2 Column buffers -- 6.1.3 Column amplifiers -- 6.1.4 CDS circuits -- 6.1.5 Row drivers -- 6.1.6 Pixel addressing -- 6.1.7 Analogue switches and multiplexers -- 6.1.8 Output amplifier -- 6.2 Off-chip electronics -- 6.2.1 General requirements. , 6.2.2 Signal amplifiers -- 6.2.3 Power supplies -- 6.2.4 Bias circuits -- 6.2.5 Noise measurements -- Chapter summary -- References.

Weitere Ausg.: Print version: Stefanov, Konstantin D. CMOS Image Sensors Bristol : Institute of Physics Publishing,c2023 ISBN 9780750332361

Sprache: Englisch

Schlagwort(e): Electronic books.

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