UID:
almahu_9948233785902882
Umfang:
1 online resource (xiv, 220 pages) :
,
digital, PDF file(s).
ISBN:
9780511791512 (ebook)
Serie:
The Cambridge RF and microwave engineering series
Inhalt:
From typical metrology parameters for common wireless and microwave components to the implementation of measurement benches, this introduction to metrology contains all the key information on the subject. Using it, readers will be able to: • Interpret and measure most of the parameters described in a microwave component's datasheet • Understand the practical limitations and theoretical principles of instrument operation • Combine several instruments into measurement benches for measuring microwave and wireless quantities. Several practical examples are included, demonstrating how to measure intermodulation distortion, error vector magnitude, S-parameters and large signal waveforms. Each chapter then ends with a set of exercises, allowing readers to test their understanding of the material covered and making the book equally suited for course use and for self-study.
Anmerkung:
Title from publisher's bibliographic system (viewed on 05 Oct 2015).
,
Machine generated contents note: 1. Measurement of wireless transceivers; 2. Instrumentation for wireless systems; 3. Signal excitation; 4. Test benches for wireless system characterization and modeling.
Weitere Ausg.:
Print version: ISBN 9781107004610
Sprache:
Englisch
URL:
https://doi.org/10.1017/CBO9780511791512
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