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  • 1
    Online Resource
    Online Resource
    Cambridge :Cambridge University Press,
    UID:
    almafu_9960119390402883
    Format: 1 online resource (xxv, 447 pages) : , digital, PDF file(s).
    Edition: 1st ed.
    ISBN: 1-107-24180-4 , 1-316-09075-2 , 1-62870-512-4 , 1-107-25048-X , 1-139-56762-4 , 1-107-24882-5 , 1-107-24799-3 , 1-107-24965-1
    Series Statement: The Cambridge RF and microwave engineering series
    Content: This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements.
    Note: Title from publisher's bibliographic system (viewed on 05 Oct 2015). , cover.pdf; Cover; Modern RF and Microwave Measurement Techniques; Title; Copyright page; Contents; Preface; Contributors; Abbreviations; Part I General concepts; 1 Transmission lines and scattering parameters; 1.1 Introduction; 1.2 Fundamentals of transmission lines, models and equations; 1.2.1 Introduction; 1.2.2 Propagation and characteristic impedance; 1.2.3 Terminations, reflection coefficient, SWR, return loss; 1.2.4 Power transfer to load; 1.3 Scattering parameters; 1.4 Microwave directional coupler; 1.4.1 General concepts; 1.4.2 The reflectometer; 1.5 Smith Chart; 1.6 Conclusions , 2 Microwave interconnections, probing, and fixturing2.1 Introduction; 2.2 Device boundaries and measurement reference planes; 2.2.1 Devices; 2.2.2 Transmission lines; 2.2.3 Circuits; 2.3 Signal-path fixture performance measures; 2.3.1 Delay; 2.3.2 Loss; 2.3.3 Mismatch; 2.3.4 Crosstalk; 2.3.5 Multiple-modes; 2.3.6 Electromagnetic discontinuity; 2.4 Power-ground fixture performance measures; 2.4.1 Non-ideal power; 2.4.2 Non-ideal ground; 2.5 Fixture loss performance and measurement accuracy; 2.6 Microwave probing; 2.6.1 Probing system elements; 2.6.2 VNA calibration of a probing system , 2.6.3 Probing applications -- in situ test2.6.4 Probing applications -- transistor characterization; 2.7 Conclusion; Part II Microwave instrumentation; 3 Microwave synthesizers; 3.1 Introduction; 3.2 Synthesizer characteristics; 3.2.1 Frequency and timing; 3.2.2 Spectral purity; 3.2.3 Output power; 3.3 Synthesizer architectures; 3.3.1 Direct analog synthesizers; 3.3.2 Direct digital synthesizers; 3.3.3 Indirect synthesizers; 3.3.4 Hybrid architectures; 3.4 Signal generators; 3.4.1 Power calibration and control; 3.4.2 Frequency and power sweep; 3.4.3 Modulation; 3.5 Conclusions , 4 Real-time spectrum analysis and time-correlated measurements4.1 Introduction; 4.1.1 Types of spectrum analyzers; 4.2 Spectrum analysis in real-time; 4.2.1 Real-time criteria; 4.2.2 Theoretical background; 4.3 Spectrum analysis using discrete Fourier transforms; 4.3.1 The Fourier transform for discrete-time signals; 4.3.2 Regularly spaced sequential DFTs; 4.4 Windowing and resolution bandwidth (RBW); 4.4.1 Windowing considerations; 4.4.2 Resolution bandwidth (RBW); 4.5 Real-time specifications; 4.5.1 Real-time criteria , 4.5.2 Minimum event duration for 100% probability of intercept at thespecified accuracy4.5.3 Comparison with swept analyzers; 4.5.4 Processing all information within a signal with no loss of information; 4.5.5 Windowing and overlap; 4.5.6 Sequential DFTs as a parallel bank of filters; 4.5.7 Relating frame rate, frame overlap, and RBW; 4.5.8 Criteria for processing all signals in the input waveform with no loss of information; 4.6 Applications of real-time spectrum analysis; 4.6.1 Displaying real-time spectrum analysis data; 4.6.2 Digital persistence displays , 4.6.3 The DPX spectrum display engine , English
    Additional Edition: ISBN 1-107-03641-0
    Additional Edition: ISBN 1-299-77266-8
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Book
    Book
    Cambridge [u.a.] : Cambridge Univ. Pr.
    UID:
    b3kat_BV041155340
    Format: XXV, 447 S. , graph. Darst.
    ISBN: 9781107036413
    Series Statement: The Cambridge RF and microwave engineering series
    Note: Includes bibliographical references and index
    Language: English
    Subjects: Engineering
    RVK:
    RVK:
    Keywords: Hochfrequenzmesstechnik
    Library Location Call Number Volume/Issue/Year Availability
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