UID:
almafu_9960118783702883
Format:
1 online resource (xiv, 314 pages) :
,
digital, PDF file(s).
ISBN:
1-108-32591-2
,
1-108-32711-7
,
1-316-34309-X
Series Statement:
The Cambridge RF and microwave engineering series
Content:
Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides• Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy• Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materialsFeaturing numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.
Note:
Title from publisher's bibliographic system (viewed on 15 Sep 2017).
Additional Edition:
ISBN 1-107-12068-3
Language:
English
URL:
https://doi.org/10.1017/9781316343098
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