Format:
1 Online-Ressource
,
illustrations
ISBN:
1424451566
,
1424451558
,
1424451574
,
9781424451562
,
9781424451555
,
9781424451579
Note:
Includes bibliographical references and index
Additional Edition:
Erscheint auch als Druck-Ausgabe IEEE International Symposium on Workload Characterization (2009 : Austin, Tex.) Proceedings of the 2009 IEEE International Symposium on Workload Characterization, IISWC Piscataway, N.J : IEEE, 2009
Language:
English
Keywords:
Konferenzschrift
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