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IEEE International Test Conference (ITC), 2010 : 2 - 4 Nov. 2010, Austin, Texas, USA ; proceedings (2010)

Institute of Electrical and Electronics Engineers ; IEEE Computer Society Test Technology Technical Council ; Institute of Electrical and Electronics Engineers Philadelphia Section

Piscataway, NJ : IEEE

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UID:

gbv_646411969

Format: Online-Ressource

ISBN: 9781424472062 , 1424472067 , 9781424472062

Note: Tagungsdaten auch angegeben als: October 31 - November 5, 2010 , Parallel als Druckausg. erschienen

Additional Edition: ISBN 9781424472055

Additional Edition: ISBN 9781424472079

Language: English

Keywords: Konferenzschrift

URL: Volltext (lizenzpflichtig)

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UB Potsdam

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2010 IEEE International Test Conference (2010)

ieee ; ieee [Contributor]

[Place of publication not identified] : IEEE

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UID:

almahu_9948698005302882

ISBN: 1-4244-7207-5

Note: Bibliographic Level Mode of Issuance: Monograph , English

Additional Edition: ISBN 1-4244-7206-7

Language: English

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HU Berlin

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