Umfang:
Online-Ressource (XV, 141 p. 76 illus. in color, online resource)
Ausgabe:
Springer eBook Collection. Physics and Astronomy
ISBN:
9783030003326
Serie:
Springer Theses, Recognizing Outstanding Ph.D. Research
Inhalt:
This thesis represents a significant advance in our understanding of the synthesis and propertiesof two-dimensional (2D) materials. The author’s work breaks new ground in the understanding of a number of 2D crystals, including atomically thin transition metal dichalcogenides, graphene, and their heterostructures, that are technologically important to next-generation electronics. In addition to critical new results on the direct growth of 2D heterostructures, it also details growth mechanisms, surface science, and device applications of “epi-grade” 2D semiconductors, which are essential to low-power electronics, as well as for extending Moore’s law. Most importantly, it provides an effective alternative to mechanically exfoliate 2D layers for practical applications
Inhalt:
Chapter1. Two-Dimensional Materials -- Chapter2. Synthesis and Properties of 2D Semiconductors -- Chapter3. Properties of Atomically Thin WSe2 Grown via Metal-Organic Chemical Vapor Deposition -- Chapter4. Direct Synthesis of van der Waals Solids -- Chapter5. Atomically Thin Heterostructures Based on Monolayer WSe2 and Graphene -- Chapter6. Tuning Electronic Transport in WSe2-Graphene Junction -- Chapter7. Atomically Thin Resonant Tunnel Diodes
Weitere Ausg.:
ISBN 9783030003319
Weitere Ausg.:
ISBN 9783030003333
Weitere Ausg.:
Erscheint auch als Druck-Ausgabe ISBN 978-3-030-00331-9
Weitere Ausg.:
Printed edition ISBN 9783030003319
Weitere Ausg.:
Printed edition ISBN 9783030003333
Weitere Ausg.:
Erscheint auch als Druck-Ausgabe Lin, Yu-Chuan Properties of synthetic two-dimensional materials and heterostructures Cham : Springer, 2018 ISBN 3030003310
Weitere Ausg.:
ISBN 9783030003319
Sprache:
Englisch
Schlagwort(e):
Nanoelektronik
;
Synthetischer Halbleiter
;
Heterostruktur
;
Dimension 2
;
Übergangsmetalldichalkogenide
;
Epitaxie
;
Van-der-Waals-Kraft
;
Elektronenmikroskopie
;
Spektroskopie
;
Wolframdiselenid
DOI:
10.1007/978-3-030-00332-6
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