Format:
1 Online-Ressource(XI, 136 p. 95 illus., 42 illus. in color.)
Edition:
1st ed. 2022.
ISBN:
9783031127519
Series Statement:
Synthesis Lectures on Digital Circuits & Systems
Content:
Introduction -- Interconnect Noise -- Clock Noise and Uncertainty -- Power Supply Noise -- Substrate Coupling Noise -- Radiation Induced Soft Error Mechanisms -- Thermally Induced Errors -- Impact of Process Variations.
Content:
This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
Additional Edition:
ISBN 9783031127502
Additional Edition:
ISBN 9783031127526
Additional Edition:
ISBN 9783031127533
Additional Edition:
Erscheint auch als Druck-Ausgabe ISBN 9783031127502
Additional Edition:
Erscheint auch als Druck-Ausgabe ISBN 9783031127526
Additional Edition:
Erscheint auch als Druck-Ausgabe ISBN 9783031127533
Language:
English
DOI:
10.1007/978-3-031-12751-9
Bookmarklink
