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  • 1
    Book
    Book
    Berlin [u.a.] :De Gruyter,
    UID:
    almahu_BV041831129
    Format: XI, 334 S. : , Ill., graph. Darst.
    Edition: 2., fully rev. and extended ed.
    ISBN: 3-11-030823-1 , 978-3-11-030823-5 , 978-3-11-030829-7
    Note: Literaturangaben
    Additional Edition: Erscheint auch als Online-Ausgabe ISBN 978-3-11-030828-0
    Language: English
    Subjects: Chemistry/Pharmacy , Physics
    RVK:
    RVK:
    RVK:
    Keywords: Röntgenstrukturanalyse
    Author information: Luger, Peter, 1943-
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    UID:
    almahu_9949244031402882
    Format: 1 online resource (334 p.)
    Edition: 2nd fully rev. and extended ed.
    ISBN: 9783110308280 , 9783110238570
    Content: An excellent book for professional crystallographers! In 2012 the crystallographic community celebrated 100 years of X-ray diffraction in honour of the pioneering experiment in 1912 by Max von Laue, Friedrich and Knipping. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. This completely revised edition is a guide for practical work in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Emphasis is placed on understanding results and avoiding pitfalls. Essential reading for researchers from the student to the professional level interested in understanding the structure of molecules.
    Note: Mode of access: Internet via World Wide Web. , In English.
    In: DGBA Backlist Complete English Language 2000-2014 PART1, De Gruyter, 9783110238570
    In: DGBA Backlist Physical Sciences 2000-2014 (EN), De Gruyter, 9783110238518
    In: DGBA Physical Sciences 2000 - 2014, De Gruyter, 9783110637212
    In: EBOOK PACKAGE Chemistry, Materials Sc, Biol, Geosc 2014, De Gruyter, 9783110369601
    In: EBOOK PACKAGE Complete Package 2014, De Gruyter, 9783110369526
    Additional Edition: ISBN 9783110370614
    Additional Edition: ISBN 9783110308235
    Language: English
    Subjects: Physics
    RVK:
    URL: Cover
    URL: Volltext  (lizenzpflichtig)
    URL: Cover
    URL: Cover
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  • 3
    Online Resource
    Online Resource
    Berlin, Germany :De Gruyter,
    UID:
    almafu_9959235631502883
    Format: 1 online resource (348 p.)
    Edition: Second fully revised and extended edition.
    ISBN: 1-5231-0057-5 , 3-11-030828-2
    Content: An excellent book for professional crystallographers! In 2012 the crystallographic community celebrated 100 years of X-ray diffraction in honour of the pioneering experiment in 1912 by Max von Laue, Friedrich and Knipping. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. This completely revised edition is a guide for practical work in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Emphasis is placed on understanding results and avoiding pitfalls. Essential reading for researchers from the student to the professional level interested in understanding the structure of molecules.
    Note: Description based upon print version of record. , Frontmatter -- , Preface to the 1st edition -- , Preface to the 2nd edition / , Contents -- , 1. Introduction -- , 2. Fundamental results of diffraction theory, X-radiation -- , 3. Preliminary experiments -- , 4. Crystal symmetry -- , 5. Diffractometer measurements -- , 6. Computer programs -- , 7. Solution of the phase problem -- , 8. Refinements -- , 9. Structure analysis at non-routine conditions -- , 10. Concluding remarks and outlook -- , Appendix: Mathematics -- , Bibliography -- , Index , English
    Additional Edition: ISBN 3-11-030823-1
    Additional Edition: ISBN 3-11-037061-1
    Language: English
    Subjects: Physics
    RVK:
    Keywords: Electronic books.
    Library Location Call Number Volume/Issue/Year Availability
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  • 4
    Online Resource
    Online Resource
    Berlin :De Gruyter,
    UID:
    almafu_9958354034202883
    Format: 1 online resource(xi,334p.) : , illustrations.
    Edition: Electronic reproduction. Berlin : De Gruyter, 2014. Mode of access: World Wide Web.
    Edition: System requirements: Web browser.
    Edition: Access may be restricted to users at subscribing institutions.
    ISBN: 9783110308280
    Content: This completely revised edition is a guide for practical work in X-ray analysis. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Essential reading from the student to the professional level.
    Note: Frontmatter -- , Preface to the 1st edition -- , Preface to the 2nd edition / , Contents -- , 1. Introduction -- , 2. Fundamental results of diffraction theory, X-radiation -- , 3. Preliminary experiments -- , 4. Crystal symmetry -- , 5. Diffractometer measurements -- , 6. Computer programs -- , 7. Solution of the phase problem -- , 8. Refinements -- , 9. Structure analysis at non-routine conditions -- , 10. Concluding remarks and outlook -- , Appendix: Mathematics -- , Bibliography -- , Index. , Also available in print edition. , In English
    Additional Edition: ISBN 9783110308235
    Additional Edition: ISBN 9783110308297
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
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  • 5
    Online Resource
    Online Resource
    Berlin :De Gruyter,
    UID:
    edocfu_BV042348985
    Format: 1 Online-Ressource (xi, 334 Seiten) : , Illustrationen, Diagramme.
    Edition: 2., fully rev. and extended ed.
    ISBN: 978-3-11-030828-0 , 978-3-11-030829-7
    Content: This completely revised edition is a guide for practical work in X-ray analysis. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Essential reading from the student to the professional level
    Additional Edition: Erscheint auch als Druck-Ausgabe Luger, Peter Modern X-ray analysis on single crystals ISBN 978-3-11-030823-5
    Language: English
    Subjects: Chemistry/Pharmacy , Physics
    RVK:
    RVK:
    RVK:
    Keywords: Röntgenstrukturanalyse
    Author information: Luger, Peter 1943-
    Library Location Call Number Volume/Issue/Year Availability
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