UID:
almafu_9961988742302883
Umfang:
1 online resource (270 pages)
Ausgabe:
First edition.
ISBN:
9783110997590
,
3110997592
,
9783110986464
,
3110986469
Serie:
De Gruyter STEM Series
Inhalt:
Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, including working and handling, 2) sample preparation, and 3) data analysis and interpretation. The book is divided in two parts i.e., Part A discusses microscopic instruments, consisting of Optical Microscope, Scanning Electron Microscopy, Atomic Force Microscopy, Field Emission Scanning Electron Microscope and X-Ray Diffraction. Part B is on spectroscopic instruments and covers FTIR Spectrometer, Raman Spectrometer, X-ray Photoelectron Spectroscopy, Ultraviolet Photoelectron Spectroscopy, Fluorescence Spectroscopy, and Nuclear Magnetic Resonance Spectroscopy.
Anmerkung:
Intro -- Preface -- Contents -- Part A: Microscopic instruments -- Chapter 1 Optical microscopy -- Chapter 2 Transmission electron microscopy -- Chapter 3 Scanning electron microscope -- Chapter 4 Scanning probe microscopy -- Chapter 5 X-ray diffraction analysis -- Part B: Spectroscopic instruments -- Chapter 6 Fourier transform infrared (FT-IR) spectrometer -- Chapter 7 Raman spectrometer -- Chapter 8 X-ray photoelectron spectroscopy -- Chapter 9 Ultraviolet photoelectron spectroscopy -- Chapter 10 Fluorescence spectroscopy -- Chapter 11 Nuclear magnetic resonance spectroscopy -- References -- Index.
Weitere Ausg.:
Print version: Kumar, Kaushik Engineering Materials Characterization Berlin/Boston : Walter de Gruyter GmbH,c2023
Weitere Ausg.:
ISBN 9783110997606
Sprache:
Englisch
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