Format:
Online-Ressource (XXI, 363 p. 216 illus., 55 illus. in color, online resource)
ISBN:
9783642401282
Series Statement:
Springer Series in Surface Sciences 52
Content:
Ellipsometry is the method of choice to determin the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in a contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years
Note:
Description based upon print version of record
,
Biomolecules at surfacesSmart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared brillant light sources for micro-ellipsometric studies of organic films -- Collection of optical constants of organic layers.
Additional Edition:
ISBN 9783642401275
Additional Edition:
Erscheint auch als Druck-Ausgabe Ellipsometry of functional organic surfaces and films Berlin : Springer, 2014 ISBN 3642401279
Additional Edition:
ISBN 9783642401275
Language:
English
Subjects:
Chemistry/Pharmacy
,
Physics
Keywords:
Ellipsometrie
;
Organische Verbindungen
;
Dünne Schicht
;
Nanostruktur
;
Oberfläche
DOI:
10.1007/978-3-642-40128-2
URL:
Volltext
(lizenzpflichtig)
Author information:
Hinrichs, Karsten 1964-
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