UID:
almahu_9949199720402882
Umfang:
XII, 422 p. 193 illus.
,
online resource.
Ausgabe:
1st ed. 1983.
ISBN:
9783642500985
Serie:
Springer Series in Chemical Physics, 27
Inhalt:
The field of X-ray spectroscopy using synchrotron radiation is growing so rapidly and expanding into such different research areas that it is now diffi cult to keep up with the literature. EXAFS and XANES are becoming interdis ciplinary methods used in solid-state physics, biology, and chemistry, and are making impressive contributions to these branches of science. The present book gives a panorama of the research activity in this field. It contains the papers presented at the International Conference on EXAFS and Near Edge Structure held in Frascati, Italy, September 13-17, 1982. This was the first international conference devoted to EXAFS spectroscopy (Extended X-ray Ab sorption Fine Structure) and its applications. The other topic of the con ference was the new XANES (X-ray Absorption Near Edge Structure), which in of experimental and theoretical developments finally appears to have terms left its infancy. The applications of EXAFS concern the determination of local structures in complex systems; we have therefore divided the subject matter into differ ent parts on various types of materials: amorphous metals, glasses, solu tions, biological systems, catalysts, and special crystals such as mixed valence systems and ionic conductors. EXAFS provides unique information for each kind of system, but the analysis of EXAFS data also poses special prob lems in each case. General problems of EXAFS data analysis are discussed, as well as developments in instrumentation for X-ray absorption using syn chrotron radiation and laboratory EXAFS.
Anmerkung:
Historical Perspective of EXAFS and Near Edge Structure Spectroscopy -- I Theoretical Aspects of EXAFS and XANES -- II EXAFS Data Analysis -- III XANES -- IV Special Crystalline Systems -- V Liquids and Disordered Systems -- VI Catalysts -- VII Biological Systems -- VIII Related Techniques - Anomalous Scattering -- IX Related Techniques - Electron Energy Loss -- X Instrumentation -- Index of Contributors.
In:
Springer Nature eBook
Weitere Ausg.:
Printed edition: ISBN 9783540124115
Weitere Ausg.:
Printed edition: ISBN 9783642500992
Weitere Ausg.:
Printed edition: ISBN 9783642501005
Sprache:
Englisch
DOI:
10.1007/978-3-642-50098-5
URL:
https://doi.org/10.1007/978-3-642-50098-5
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