UID:
almahu_9948026629102882
Format:
1 online resource (237 p.)
Edition:
1st ed.
ISBN:
1-280-63054-X
,
9786610630547
,
0-08-045789-4
Series Statement:
Thin films and nanostructures ; v. 33
Content:
In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for g
Note:
Description based upon print version of record.
,
Cover; Thin Films and Nanostructures; Dedication; Contents; Waveguide Spectroscopy of Thin Films; Foreword; Acknowledgments; Introduction; Interaction of Light with Matter; Power States in Solids; Macroscopic Aspects of Solids; Spectroscopy of Optical Guided Modes; Waveguide Properties of Thin Films and Surface Layers; Reflection of the Plane Wave from Interface of Two Media; Modes in Planar Waveguiding Structures; Dispersion Curves and the ''Cut-Off'' Condition; Input of Radiation into Waveguide by the Prism Coupler; Excitation of Guided Light Modes and Measurement of Their Parameters
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Optical Losses in WaveguidesDispersion Equations for the Imaginary Part of the Mode Propagation Constant; Measurement of Losses in Waveguides; Leaky and Plasmon Modes in Thin-Film Structures; Fabrication of Waveguiding Structures; New Applications of the m-Line Technique for Studying Thin-Film Structures; Recording the Spatial Distribution of the Light-Beam Intensity; Photodetectors in Waveguide Measurement Setups; Light Sources and Characterization of Light Beams; Techniques and Setup for the Measurement of Light Beam Intensity and its Spatial Distribution
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Mathematical Processing the Recorded Spatial DistributionDetermination of the Light-Beam Parameters; Spatial Distribution of the Light Beam Intensity Reflected from the Prism Coupler and Measurements of Thin-Film Parameters; Spatial Fourier Spectroscopy of Guided Modes: Measuring Thin-Film Parameters; Fourier Transform Applications for Studying the Spatial Distribution of the Reflected Light Beam Intensity; Studying the Properties of Waveguiding Films; Features of Recording the Intensity Distribution and Measuring the Complex Propagation Constants of Modes
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Determination of Thin-Film ParametersCharacterization of Thin Films by Prism Coupling of Leaky Modes; Basic Concepts and Instrumentation; Determinations of Waveguiding Film Parameters; Leaky Modes in Thin-Film Structures; Determination of Parameters of Metal Films and Surface Layers of Bulk Metal by the Plasmon Modes Excitation Technique; Measurements of Absorption Spectra of Thin Films; Absorption Optical Spectrophotometry: Possibilities and Limitations; Instrumentation of the Waveguide Spectroscopy of Thin Films
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Special Features of Absorption Spectra Recording by Waveguide Spectroscopy and their ProcessingMeasurement of Absorption Spectra by the Fourier Spectroscopy of Guided Modes; Applications of the Waveguide Spectroscopy Techniques in Sensor Systems; Integrated-Optics Sensors and their Features; Gas Thin-Film Sensors; Physical Origin of Processes on Surfaces of Thin-Film Sensors; Evaluation of the Adlayer Parameters; Sensors with Recording of the Light Beam Reflection Coefficient; Gas Sensors; Integrated-Optics Sensors of the Angular Movement; Waveguide Microscopy of Thin Films
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Optical Nonlinearity in Thin Films at Low-Intensity Light
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English
Additional Edition:
ISBN 0-12-088515-8
Language:
English
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