In:
Crystal Research and Technology, Wiley, Vol. 47, No. 10 ( 2012-10), p. 1083-1087
Abstract:
Potassium dihydrogen phosphate (KDP) crystals were restrained to grow in two dimensions only, using a specially designed platform. This enables us to grow the blanks of frequency conversion elements that satisfy type‐II phase matching direction out of a type‐II phase‐matched seed crystal. Synchrotron radiation topography was used to study the growth mechanism of these profiling grown KDP crystals. It is found that both dislocation growth mechanism and layer growth mechanism were involved in the growing process. Inclusions, growth striations and dislocations were the main defects that influenced the crystalline quality of these crystals. High‐resolution X‐ray diffraction was employed to study the lattice integrality of the crystal.
Type of Medium:
Online Resource
ISSN:
0232-1300
,
1521-4079
DOI:
10.1002/crat.201200209
Language:
English
Publisher:
Wiley
Publication Date:
2012
detail.hit.zdb_id:
1480828-6
