In:
Surface and Interface Analysis, Wiley, Vol. 37, No. 2 ( 2005-02), p. 211-216
Abstract:
We improved the photoelectron spectro‐holography apparatus for high‐speed and high‐energy photoelectron detection. The combination of an aperture for ±1.4° acceptance angle at the diffraction plane and a 64‐channel detector realized the high‐speed XPS and rapid x‐ray photoelectron diffraction (XPED) measurements Furthermore, high‐energy XPS and XPED measurements excited by Cu Kα have been performed. Copyright © 2005 John Wiley & Sons, Ltd.
Type of Medium:
Online Resource
ISSN:
0142-2421
,
1096-9918
Language:
English
Publisher:
Wiley
Publication Date:
2005
detail.hit.zdb_id:
2023881-2