Online Resource
Elsevier BV
;
1988
In:
Microelectronics Reliability Vol. 28, No. 1 ( 1988-1), p. 59-73
In:
Microelectronics Reliability, Elsevier BV, Vol. 28, No. 1 ( 1988-1), p. 59-73
Type of Medium:
Online Resource
ISSN:
0026-2714
DOI:
10.1016/0026-2714(88)90327-7
Language:
English
Publisher:
Elsevier BV
Publication Date:
1988
detail.hit.zdb_id:
2022028-5
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