Online Resource
Elsevier BV
;
2013
In:
Microelectronics Reliability Vol. 53, No. 4 ( 2013-4), p. 554-559
In:
Microelectronics Reliability, Elsevier BV, Vol. 53, No. 4 ( 2013-4), p. 554-559
Type of Medium:
Online Resource
ISSN:
0026-2714
DOI:
10.1016/j.microrel.2012.11.009
Language:
English
Publisher:
Elsevier BV
Publication Date:
2013
detail.hit.zdb_id:
2022028-5
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