In:
EPJ Web of Conferences, EDP Sciences, Vol. 205 ( 2019), p. 02006-
Abstract:
We report the direct wavefront characterization of an intense ultrafast high-harmonic-seeded soft X-ray laser (λ=32.8 nm) depending on the arrival time of the seed pulses by high-resolution ptychographic imaging and subsequently perform single-shot nanoscale imaging.
Type of Medium:
Online Resource
ISSN:
2100-014X
DOI:
10.1051/epjconf/201920502006
Language:
English
Publisher:
EDP Sciences
Publication Date:
2019
detail.hit.zdb_id:
2595425-8