In:
ITM Web of Conferences, EDP Sciences, Vol. 30 ( 2019), p. 10003-
Kurzfassung:
The article presents an analysis of microwave LSI behavior under radiation exposure at the functional-logical level of description. The analysis is based on fuzzy digital automaton and topological probabilistic models of workability assessment. It is shown that in certain cases both deterministic and non-deterministic failures are typical. Each operation threshold in logic elements under radiation influence has a zone of uncertainty and can be expressed quantitatively by a fuzzy number. This case, the real nature of microwave LSI radiation behavior is determined by the specific ratio of radiation-sensitive parameters of its elements and by taking into account the influence of their statistical scatter. Methods are proposed for simulating failures of microwave LSI under radiation exposure that are based on the model of a fuzzy digital Brauer automaton and a probabilistic reliability automaton.
Materialart:
Online-Ressource
ISSN:
2271-2097
DOI:
10.1051/itmconf/20193010003
Sprache:
Englisch
Verlag:
EDP Sciences
Publikationsdatum:
2019
ZDB Id:
2755683-9
