In:
Applied Physics Letters, AIP Publishing, Vol. 79, No. 17 ( 2001-10-22), p. 2713-2715
Abstract:
We report the growth of high-quality GaN on a Si(111) substrate using a five step-graded AlxGa1−xN (x=0.87–0.07) interlayer between GaN epilayer and AlN buffer layer by ultrahigh vacuum chemical vapor deposition. The crack density and the surface roughness of the GaN layer grown on the graded AlxGa1−xN interlayer were substantially reduced, compared to those of GaN grown on an AlN buffer layer. Significant improvement in the structural and optical properties of the GaN layer was also achieved by the use of a graded interlayer. These results are attributed to the decrease of the lattice mismatch between GaN and AlN layer, and the reduction of the thermal stress by the graded interlayer.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
2001
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0