In:
Applied Physics Letters, AIP Publishing, Vol. 79, No. 26 ( 2001-12-24), p. 4363-4365
Kurzfassung:
A defect characterization method is presented, the time domain measurement of spin-dependent recombination (TSR). Recombination between paramagnetic states is changed rapidly by electron spin resonant excitation through strong nanosecond microwave pulses. After the pulse, a slow relaxation of the recombination rate towards its steady state takes place. By measuring the current transient after the resonant pulse, information about dissociation and recombination probabilities of spin pairs is directly obtained for a distinct recombination path. Dangling bond recombination in microcrystalline silicon was used as model process for the demonstration of TSR.
Materialart:
Online-Ressource
ISSN:
0003-6951
,
1077-3118
Sprache:
Englisch
Verlag:
AIP Publishing
Publikationsdatum:
2001
ZDB Id:
211245-0
ZDB Id:
1469436-0
