In:
Journal of Applied Physics, AIP Publishing, Vol. 91, No. 10 ( 2002-05-15), p. 7751-7753
Abstract:
Single-twin (T)-domain NiO films were obtained by stress induced during the growth, and the exchange anisotropy between NiO and NiFe films was studied by using micromagnetic modeling. The compressive strain along the [111] is −7.16×10−4, which forces spins of NiO to lie on the (111) plane parallel to the film surface. The neutron diffraction shows that the moments of NiO predominantly lie in the film plane with random orientations, that is, the NiO is of a single T-domain, and multi-spin-rotation-domains in the film plane. The effective crystalline anisotropy of (111) NiO, calculated from micromagnetic modeling, is 2.4×104 ergs/cm3. The majority of NiO moments at the interface switched along with NiFe moments due to the low effective anisotropy, leading to a large coercivity and a low exchange field.
Type of Medium:
Online Resource
ISSN:
0021-8979
,
1089-7550
Language:
English
Publisher:
AIP Publishing
Publication Date:
2002
detail.hit.zdb_id:
220641-9
detail.hit.zdb_id:
3112-4
detail.hit.zdb_id:
1476463-5
