In:
Applied Physics Letters, AIP Publishing, Vol. 84, No. 2 ( 2004-01-12), p. 170-172
Kurzfassung:
Pure and doped nanocrystalline ZnO films of 0.1–1.0 μm thickness were prepared by spray pyrolysis techniques. Structural properties of these thin films were investigated by electron microscopy, force microscopy, x-ray diffractometry, ellipsometry, and optical spectroscopy. Using Ti:sapphire laser pulses, the second-harmonic efficiency of the films was measured. A correlation between measured efficiency and the grain shape in the polycrystalline layers is reported. Moreover, measurements of the angular dependence of the second-harmonic intensity are indicative of the dominant role of bulk effects over surface effects for the second-harmonic generation in such films.
Materialart:
Online-Ressource
ISSN:
0003-6951
,
1077-3118
Sprache:
Englisch
Verlag:
AIP Publishing
Publikationsdatum:
2004
ZDB Id:
211245-0
ZDB Id:
1469436-0
