In:
Applied Physics Letters, AIP Publishing, Vol. 86, No. 1 ( 2005-01-03)
Abstract:
Refractive x-ray lenses have recently been applied for imaging and scanning microscopy with hard x rays. We report the application of refractive lenses in an optical scheme for high-resolution x-ray diffraction, performed at a high brilliance synchrotron radiation source. An experimental proof of principle and a theoretical discussion are presented. In particular, we observe the x-ray diffraction pattern from a two-dimensional photonic crystal with 4.2μm periodicity, which normally is employed to scatter light in the infrared.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
2005
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0