In:
Journal of Applied Physics, AIP Publishing, Vol. 87, No. 9 ( 2000-05-01), p. 4918-4920
Abstract:
The exchange coupling between ferromagnetic Ni81Fe19 and antiferromagnetic (AF) PtxMn1−x films prepared by rf and dc magnetron sputtering has been investigated. The Pt content in the PtxMn1−x film is in the range of 0 at. % & lt;x & lt;20 at. %. The exchange field and coercivity were found to depend strongly on the deposition conditions and the AF film composition. X-ray diffraction measurements and transmission electron microscopy measurement showed a γ-PtMn phase with a disordered fcc structure when the PtxMn1−x was deposited on top of the Ni81Fe19 layer. The exchange bias was found to depend on the texture and film composition of the γ-PtMn layers.
Type of Medium:
Online Resource
ISSN:
0021-8979
,
1089-7550
Language:
English
Publisher:
AIP Publishing
Publication Date:
2000
detail.hit.zdb_id:
220641-9
detail.hit.zdb_id:
3112-4
detail.hit.zdb_id:
1476463-5
