In:
The Journal of Chemical Physics, AIP Publishing, Vol. 90, No. 4 ( 1989-02-15), p. 2162-2166
Kurzfassung:
Monochromatic synchrotron radiation was used to excite selectively core electrons of the carbon and fluorine atoms in carbon tetrafluoride and silicon and fluorine in silicon tetrafluoride. The fragmentation processes were examined using time-of-flight mass spectroscopy. The mass spectra show the distribution of ions collected in coincidence with low and high energy electrons. Distinct changes in the mass spectra with atomic site of excitation and photon energy are observed. The observation of F2+ ions following fluorine 1s excitation in SiF4 provides significant evidence for a ‘‘valence bond depopulation’’ mechanism involving the formation of a localized, two-hole final state that persists on the time scale of fragmentation. In contrast, no F2+ was observed for CF4, which indicates that fragmentation for this molecule is more characteristic of a delocalized two-hole state.
Materialart:
Online-Ressource
ISSN:
0021-9606
,
1089-7690
Sprache:
Englisch
Verlag:
AIP Publishing
Publikationsdatum:
1989
ZDB Id:
3113-6
ZDB Id:
1473050-9
