In:
Applied Physics Letters, AIP Publishing, Vol. 40, No. 6 ( 1982-03-15), p. 499-501
Abstract:
Raman spectroscopy has been combined with ion bombardment to obtain chemical compound identification as a function of depth in films containing Fe2O3. Experiments were performed using Fe2O3 single crystals, oxidized iron foil, and oxidized stainless steel. Low sensitivity to sputter induced chemical changes is a major advantage of the technique, allowing reliable chemical profiles to be obtained for these thin-film oxides.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
1982
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0